Submission

Authors of accepted papers (oral and poster) will receive notifications and instructions on manuscript submission to my SPIE system following assigned link for each SPIE proceeding volume. Manuscripts must follow the Format Template from SPIE available for download at www.aomatt.org.



Submit an Abstract for this Conference


Submit your abstracts on the following topics:


Conference 1: Large Mirror and Telescopes

  1. Mirrors for large astronomical and space telescopes

  2. Light-weighted mirror technology

  3. Large deployable mirror and telescopes

  4. New and innovative mirror and telescope designs

  5. Advanced testing methods for large mirror

  6. Support systems and structures

  7. New material for large mirrors


Conference 2: Advanced optical manufacturing Technologies

  1. Advanced optical manufacturing technologies

  2. Aspheric optics design, manufacturing and testing

  3. Ultra-precision freeform surfaces design, manufacturing and Testing

  4. Super-precision optical manufacturing

  5. Optical thin film coatings

  6. Diamond turning technology

  7. Optical design and simulation software and tool

  8. Optoelectronics components and modules integration and manufacturing

  9. Opto-mechanical components and devices


Conference 3: Optical test and measurement Technology and Equipments

  1. Test for aspheric optical surface

  2. Test for super- precision optical surface

  3. Measurement for super smooth surface

  4. Measurement of optical thin film

  5. Test with infrared technologies

  6. Optical contamination

  7. Optical test and measurement for nanometer technology

  8. New and innovative metrology and equipment

  9. Analysis and modeling tools and software


Conference 4:Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems

  1. Micro and nano optical system design, manufacturing and testing

  2. Nano metrology technology and tools

  3. Nanoscale imaging and sensing technologies

  4. Nanofluidics device design, fabrication and testing

  5. Fabrication of MEMS/MOEMS devices

  6. Testing and Characterization of MEMS/MOEMS

  7. MEMS/MOEMS reliability

  8. Packaging of MEMS/MOEMS devices

  9. Next generation lithography

  10. EUVL research and development

  11. Advances in thin film coating for MEMS

  12. Microfluidics, BioMEMS, and Medical Microsystems


Conference 5:Opto-Electronics Material and Devices for Sensing and Imaging

  1. Properties of optoelectronic materials

  2. Nano materials for optoelectronic device application

  3. Properties of Sensing materials in detector technology

  4. Detector design, integration and fusion

  5. Detector data collection and analysis

  6. Vision and image processing

  7. Novel display and processing techniques

  8. Organic and polymer light emitting device for displays and lighting

  9. LED and OLED related technologies

  10. Thin film transistors technology

  11. Organic and polymer memory devices


Conference 6:Smart Structure and Materials in Advanced Optical Technology

  1. Smart structures and materials

  2. Structural health monitoring

  3. Optical fiber sensors and applications

  4. Design, fabrication, and application of metamaterials

  5. Plasmonic devices and sensors

  6. Directive antenna

  7. Design, fabrication, and application of nanostructures

  8. Passive and active vibration isolation systems

  9. Shape memory alloys

  10. SMA- and piezo-based materials and systems

  11. Aircraft, MAV/UAV and morphing systems


Conference 7:Sub-nanometer Accuracy Measurement for Synchrotron Optics and X-ray Optics

  1. Requirements and specifications for synchrotron radiation and free electron laser mirrors, for wavefront preserving and nano-focusing x-ray mirrors

  2. Measurement science and technology for sub-nanometer (or sub-50-nrad) accuracy for meter-scale plane, spherical and aspherical-mirrors

  3. Design and measurement of next-generation surface profilometer with:

  4. Sub-nanometer accuracy

  5. Easy and fast calibration process

  6. Possibility to measure high-spatial-frequency

  7. Small aperture autocollimator development with ultra high accuracy

  8. Calibration methods and devices for sub-nanometer accuracy

  9. Manufacturing of sub-nanometer accuracy mirrors

  10. High accuracy in-situ metrology at beam lines



For more information, contact: optfab@163.com


Phone/Fax: 86-028-85100583