The 8th International Symposium on

26-29 April 2016
Suzhou, China
HomePagethe first step: (Submit your paper to [toAOMATT]) system. The second setp: (submit the paper to [SPIE])
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@ Detail
Call for papers (English)(Chinese)
Invitation to Participate
Technical Program (PDF)
Printed Call for Papers (PDF)
Sample Manuscript (pdf doc)
Templates for Download (doc)
Copyright Transfer Form (PDF )
Invitation (PDF Doc)
Hotel Order Form outside the mainland of China (Doc)

Visa Letter Request Form (pdf doc)

Registration Form for Chinese(Pdf)
Registration Form outside the mainland of China(Pdf)


Special Events
Past Program
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstract
Submission Guidelines
Yang Li


  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2016


Plenary Talk

April 26: 9:00-12:00, 13:00-17:00
Suzhou International Conference Center

Less is More: Extreme Optics with Zero Refractive Index

Dr. Eric Mazur
Harvard University

Balkanski Professor of Physics and Applied Physics at Harvard University and Area Dean of Applied Physics

Large Optical Telescopes in the Era of Large Wide-field

Dr. David R. Silva

Director, National Optical Astronomy Observatory (NOAO)

The European Extremely Large Telescope (E-ELT) Revolution is under construction

Dr. Marc Cayrel
European Southern Observatory (ESO)

Project Manager, E-ELT Optomechanics

Ultra-precision Lens Fabrication via Moulding: Advances and Challenges

Dr. Liangchi ZHANG
University of New South Wales

Professorial Fellow of Australian, Head of Lab for Precision & Nano Processing  Technologies, UNSW Australia

Advancing Ultra Precision Machining  to High Performance

Dr.-Ing. Oltmann Riemer
University of Bremen

Head of the Laboratory for Precision Machining co-ordinating and administrating the entire R&D work of LFM

Micro/nano Optics for Flexible Functional Devices: Today and Future

Dr. Linsen CHEN

Soochow University

Chief of National United Engineering Research Center of Digital Optical Imaging and Display, and Director of Holography & Optical Information   
Processing Committee of Chinese   Optical Society

New Angles on Angle Metrology: Approaching Fundamental Limits

Dr. Ralf D. Geckeler
Physikalisch-Technische Bundesanstalt, Germany

Head of Length and Angle Graduations Group

Functional Photonic Nanostructures£ºFrom Thin Films and Slits to Catenaries

Dr. Xiangang LUO

Vice President of Institute of Optics and Electronics (IOE), CAS
Director of State Key Laboratory of  Optical Technologies for   Nano-Fabrication and Micro-Engineering




Location: Lobby of Suzhou International Conference Center



All Day

8:30-9:00  Opening Ceremony
9:00-12:00£»13:00-17:00  Plenary Presentation


18:30-20:30 Buffet Reception




All Day

Conference Report
Location£ºSuzhou International Conference Center


Welcome Party
Location£º Suzhou International Conference Center






Foreign manufacturers technical seminar
Location: Room Fengle
Preparation of Poster£ºShowroom of Suzhou Conference Center



Room: Showroom of Suzhou International Conference Center


Visiting of Local Research Labs


Conference 1: Large Mirror and Telescopes
Myung Cho, NOAO (USA)
Bin FAN, Institute of Optics and Electronics,
CAS (China)
AOMATT2016 SPIE Proceeding Vol. 9682

We invite you to submit papers on the following and related topics to this conference.
• Mirrors for large astronomical and space telescopes
• Light-weighted mirror technology
• Large deployable mirror and telescopes
• New and innovative mirror and telescope designs
• Advanced testing methods for large mirror
• Support systems and structures
• New material for large mirrors
• Innovative concepts and designs

Conference 2: Advanced Optical Manufacturing Technologies
Wenhan JIANG, Academician, Chinese Academy of Engineering, IOE, CAS (China)
Li YANG, COMT, COS (China)
Oltmann Riemer, IWT Univ. of Bremen (Germany)
Shengyi LI, National Univ. of Defense Technology (China)
Yongjian WAN, Institute of Optics and Electronics, CAS (China)
AOMATT2016 SPIE Proceeding Vol. 9683

Please submit papers on the following and related topics to this conference.
• Advanced optical manufacturing technologies
• Aspheric optics design, manufacturing and testing
• Ultra-precision freeform surfaces design, manufacturing and Testing
• Super-precision optical manufacturing
• Optical thin film coatings
• Advanced Diamond turning technology
• Magnetorheological Optical Processing
• Advanced ion beam finishing and atmospheric plasma technology
• EEM (Elastic Emission Machining) and CVM (Chemical Vaporization Machining) processing technology for super smooth surface with atomic lever
• Optical design and simulation software and tool
• Optoelectronics components and modules integration and manufacturing
• Opto-mechanical components and devices
• Laser manufacturing technology and equipment

Conference 3: Optical Test, Measurement Technology, and Equipment
Yudong ZHANG, Institute of Optics and Electronics, CAS (China)
Fan WU, Institute of Optics and Electronics, CAS (China)
Ming XU, Fudan University (China)
Sandy To, Hong Kong Polytechnic University (China)
AOMATT2016 SPIE Proceeding Vol. 9684

Please submit papers on the following and related topics to this conference.
• Test for optical freeform surface
• Test for aspheric optical surface
• Test for super- precision optical surface
• Measurement for super smooth surface
• Measurement of optical thin film
• Test with infrared technologies
• Optical contamination
• Optical test and measurement for nanometer technology
• New and innovative metrology and equipment
• Analysis and modeling tools and software

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems
Tianchun YE, Director of Institute of Microelectronics, CAS (China)
Tingwen XING£¬Institute of Optics and Electronics (IOE), CAS (China)
Song HU, Institute of Optics and Electronics, CAS (China)
AOMATT2016 SPIE Proceeding Vol. 9685

Papers on the following and related topics should be submitted to this conference.
• Micro and nano optical system design, manufacturing and testing
• Nano metrology technology and tools
• Nanoscale imaging and sensing technologies
• Nanofluidics device design, fabrication and testing
• Fabrication of MEMS/MOEMS devices
• Testing and Characterization of MEMS/MOEMS
• MEMS/MOEMS reliability
• Packaging of MEMS/MOEMS devices
• Next generation lithography
• EUVL research and development
• Advances in thin film coating for MEMS
• Microfluidics, BioMEMS, and Medical Microsystems

Conference 5: Opto-Electronics Material and Devices for Sensing and Imaging
Yadong JIANG, University of Electronic Science and Technology of China
Bernard Kippelen, Center of Organic Photonics and Electronics, Georgia Institute of Technology (USA)
Junsheng YU, State Key Laboratory of Electronic Thin Films and Integrated Devices (China)  
AOMATT2016 SPIE Proceeding Vol. 9686

The primary topics for this conference are as following:
• Properties of optoelectronic materials
• Nano materials for optoelectronic device application
• Properties of sensing materials in detector technology
• Detector design, integration and fusion
• Detector data collection and analysis
• Vision and image processing
• Novel display and processing techniques
• Organic and polymer light emitting device for displays and lighting
• LED and OLED related technologies
• Thin film transistors technology
• Organic and polymer memory devices

Conference 6: Smart Structure and Materials in Advanced Optical Technology
Xiangang LUO, Institute of Optics and Electronics, CAS  
Minghui HONG, National University of Singapore (Singapore)
Min GU, Swinburne University of Technology (Australia)
AOMATT2016 SPIE Proceeding Vol. 9687

Papers on the following and related topics are welcome for this conference.
• Smart structures and materials
• Metal-material design, manufacture, characterization and application
• Optical fiber sensors and applications
• Plasmonic devices and sensors
• Directive antenna
• Design, fabrication, and application of nanostructures
• Passive and active vibration isolation systems
• Shape memory alloys
• SMA- and piezo-based materials and systems
• Aircraft, MAV/UAV and morphing systems

Conference 7: Sub-nanometer Accuracy Measurement for Synchrotron Optics and X-ray Optics
Shinan QIAN, Brookhaven National Laboratory (USA)
Mourad Idir, Brookhaven National Laboratory (USA)
Daniele Cocco, SLAC National Accelerator
Laboratory (USA)
Tiqiao XIAO, Shanghai Synchrotron Radiation Facility (China)
Kazuto Yamauchi, University of Osaka (Japan)
AOMATT2016 SPIE Proceeding Vol. 9688

Papers on the following and related topics are welcome for this conference.
• Requirements and specifications for synchrotron radiation and free electron laser mirrors, for wavefront preserving and nano-focusing x-ray mirrors
• Measurement science and technology for sub-nanometer (or sub-50-nrad) accuracy for meter-scale plane, spherical and aspherical-mirrors
• Design and measurement of next-generation surface profilometer with:
Sub-nanometer accuracy
Easy and fast calibration process
Possibility to measure high-spatial-frequency
Small aperture autocollimator development with ultra high accuracy
• Calibration methods and devices for sub-nanometer accuracy
• Manufacturing of sub-nanometer accuracy mirrors
• High accuracy in-situ metrology at beam lines

WORKSHOP-Innovation in Emerging Photon Industry
Wanyin DUAN, Fudan University (China)
Wu Fan, Institute of Optics and Electronics (China)
Qiming XIN, Beijing Institute of Technology (China)


@ Important Dates

Conference Dates
April 26-29, 2016
Abstract Due:
Jan 30, 2016

Manuscript Due:
March 30, 2016

Registration Date
April 25, 2016
Publishing Date

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society for Optics and Photonics

@ Cooperating

*Soochow University

Copyright @ Organizing Committee All Rights Reserved
AOMATT China 2016