The 5th International Symposium on

26-29 April 2010
Dalian, China
HomePage   (Submit your abstract through "toAOMATT")[Technical Program final version Download]
Register Conferences Special Events Travel / General Past Program Chair Info


@ Detail
Notice (English)(Chinese)
Invitation to Participate
Technical Program (PDF)
Printed Call for Papers (PDF)
Sample Manuscript (pdf)
Templates for Download (doc)
Copyright Transfer Form (pdf )
Invitation (PDF Doc)
Hotel Order Form(pdf) (Doc)

Visa Letter Request Form (pdf doc)

Registration Form(Pdf)


Special Events
Past Program
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstract
Submission Guidelines
Yang Li
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2010



Conference 3: Optical Test and Measurement Technology and Equipments SPIE VOL.7656

Conference Chairs:
ZHANG Yudong, Director of Institute of Optics and Electronics, CAS (China)
Jose M. Sasian, Prof. of University of Arizona (USA)
XIANG Libin, Director of Opto-electronic Research Academy of Chinese Academy of Science (China)
Sandy To, Hong Kong Polytechnic University (China)

Program Committee:
WU Shibing, Institute of Optics and Electronics, CAS (China)
James R. Torley, University of Colorado (USA)
XU Qiao, Chengdu Fine Optical Engineering Research Center (China)
Tadashi Hatano, Tohoku University (Japan)
Hexin Wang, Optical Technology Carl Zeiss AG (Germany)
Mike Conroy, Taylor Hobson Limited (UK)
ZHANG Rongzhu, Sichuan University (China)
Peter C. Chen, The Catholic University (USA)
Mary G. Turner, InfoTek Information Systems (USA)
ZHENG Ligong, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)
Malacara-Doblado Daniel, Centro de Investigaciones en Optica, A. C.Mexico( Mexico)
YANG Yongying, Zhejiang University (China)
Sondes Trabelsi-Bauer, Karlsruhe Research Center (Germany)
NI Qian, Xian Technological University (China)
ARAFA. H. ALY, Chonnam National University (Korea)

Please submit papers on the following and related topics to this conference.

  • Modern interferometric technologies
  • Aspherical optical surface testing
  • Super- precision optical surface testing
  • Measurement of super smooth surface
  • Measurement of optical thin film
  • Test in infrared components and systems
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software



@ Important Dates

Conference Dates
26ĘC29 April 2010
Abstract Due:
15 December 2009
Manuscript Due:
30 March 2010
Registration Date
25 April 2010
Publishing Date
30 September 2010

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society for Optics and Photonics

@ Cooperating

* German Society of Applied Optics
* Optics and Photonics Society of Singapore
* Optical Society of SichuanProvince
* State Key Laboratory of Microfabrication
* Dalian Institute of Chemical Physics, CAS
* Dalian University of Technology
* Changchun Institute of Fine Optical Machining and Physics, CAS
* ChangchunUniversity of Science and Technology
* NationalUniversity of Defense Technology
* Harbin Institute of Technology
* Beijing Institute of Technology
* University of Electronic Science and Technology of China
* Crystechcoating Inc.

Copyright @ Organizing Committee All Rights Reserved
AOMATT China 2010