The 5th International Symposium on

26-29 April 2010
Dalian, China
HomePage   (Submit your abstract through "toAOMATT")[Technical Program final version Download]
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@ Detail
Notice (English)(Chinese)
Invitation to Participate
Technical Program (PDF)
Printed Call for Papers (PDF)
Sample Manuscript (pdf)
Templates for Download (doc)
Copyright Transfer Form (pdf )
Invitation (PDF Doc)
Hotel Order Form(pdf) (Doc)

Visa Letter Request Form (pdf doc)

Registration Form(Pdf)


Special Events
Past Program
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstract
Submission Guidelines
Yang Li
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2010



AOMATT2010 Daily Event Schedule General


April 25,2010



*Attendee Domestic Registration in DalianWorldExpoCenter

Add£ºNo 10, F Area, Xinghai Square of Dalian

Attendee Abroad Registration in Howard Johnson Parkland Hotel Dalian,

Add. No 95,Huizhan Road ,Sha hekou District,Dalian

April 26,2010



8:30-9:00 Opening Ceremony/Dalian World Expo Center

Multifunctional Hall

9:00-12:30 Plenary Presentation




Multifunctional Hall

Academician Forum: Manufacturing Science Progress



Welcome Banquet

Add£ºXinhai Square of Dalian

April 27,2010



8:30-12:00/ DalianWorldExpoCenter

Oral Presentation in 6 Specific Conferences


13:30-17:00/ DalianWorldExpoCenter

Oral Presentation in 6 Specific Conferences

April 28,2010



8:30-12:00/ DalianWorldExpoCenter

¢ñ.Oral Presentation in 6 Specific Conferences

¢ò.Preparation of Post Presentation



13:30-17:00/ DalianWorldExpoCenter

Post Presentation/ Exhibition Hall




DalianWorldExpoCenter, Conference Hall

FORUM for Advanced Optical Manufacturing and Testing Technology and Equipment


April 29,2010


Touring in Lushun and Dalian

April 30,2010

Conference Close

¢ò.Plenary Presentation
2010.4.26, 9:00-12:30Multifunctional Hall, DalianWorldExpoCenter

1. SAGEM, France
Dr. Roland Geyl£º
The Challenges From VLT to ELT project in astronomy and from DUV to EUV in lithography optics

2. NationalUniversity of Singapore
Dr. Hong Minghui
Laser Precision Engineering: A Versatile Micro- & Nanomanufacturing Means

3£®CHUBU University, Japan , Dept. of Mechanical Engineering£¬Head of InnovationCenter,
Dr.and Prof. Yoshiharu Namba
Fabrication of Pt/C multilayer-coated mirrors for hard X-ray telescopes

4. 2010 President of OSA£¬Dean and Prof. of College of Optical Sciences, UniversityArizona, USA
Dr.and Prof. James C. Wyant
The Development in Optical Testing Technology during the Last Decade


¢ó. Academician Forum: Manufacturing Science Progress
2010.4.26,13:30-17:00 Multifunctional Hall, DalianWorldExpoCenter

1.Dalian Institute of Chemical Physics, ChineseAcademy of Science
Academician, ChineseAcademy of Science
San FengTing
Progress of Chemical Oxygen Iodine Laser

2.Shanghai Institute of Optics and Fine-Mechanical Engineering, ChineseAcademy of Science
Academician, Chinese Academy of Engineering
Fan DianYuan
The Challenges to the Advanced Optical Manufacturing Technology from Laser Fusion Engineering

3£®Shanghai Institute of Technical Physics, ChineseAcademy of Science
Academician, ChineseAcademy of Science
Chu JunHao
Advanced Spectroscopy for Characterization of Materials

4.Nanjing Institute for Astronomy Optical Technology, ChineseAcademy of Science
Academician,ChineseAcademy of Science
Chui Xiangqun£º
The Advanced Optical Technologies of LAMOST Telescope

Conference 1: Large Mirror and Telescopes SPIE VOL.7654

Conference Chairs:
JIANG Wenhan, Academician, Chinese Academy of Engineering (China)
Myung K. Cho, National Optical Astronomy Observatory (USA)
WU Fan, Institute of Optics and Electronics, CAS (China)

Program Committee:
Jim Burge, University of Arizona (USA)
Bernard Delabre, ESO (Germany)
Eric RUCH, REOSC Optics, SAGEM (France)
Young-Soo KIM, Korea Astronomy & Space Science Institute (Korea)
Matt Johns, Carnegie Observatories (USA)
YU Jingchi, Suzhou University (China)
Sung-Kie Youn, Korea Advanced Institute of Science and Technology (KAIST) (Korea)
GAO Bilie, Nanjing Institute of Astronomical Optical Technology, CAS (China)

We invite you to submit papers on the following and related topics to this conference.

  • Mirrors for large astronomical and space telescopes
  • Light-weighted mirror technology
  • Large deployable mirror and telescopes
  • New and innovative mirror and telescope designs
  • Advanced testing methods for large mirror
  • Support systems and structures
  • New material for large mirrors

Conference 2: Advanced Optical Manufacturing Technologies SPIE VOL.7655

Conference Chairs:
YANG Li, COMT, COS (China)
Yoshiharu Namba, Chubu University (Japan)
David D. Walker, University College Landon (UK)
LI Shengyi, National University of Defense Technology (China)

Program Committee:
FU Xiuhua, Changchun University of Science and Technology (China)
Masahide Katsuki, Toshiba Machine Co. Ltd (Japan)
CHENG Haobo, Beijing Institute of Technology (China)
Karen Scott, The Aerospace Corp (USA)
Richard Freeman, ZEEKO Ltd (UK)
TIAN Ailing, Xian Polytechnic University (Chi na)
Paul Shore, Cranfield University (UK)
Wenda Jiang, LPI Precision Optics Ltd. (Hong Kong)
Richard Zunke, Fraunhofer Institute of Production Technology(Germany)
HUI Changshun, Tianjin Jinhang Institute of Technology Physics (China)
LI Cijuan, The Eleventh Institute of China Electronics Technology Group Co.
Gaven F. Chapmam, Moore Precision Tool (USA)
Ma Zheng, Xian Institute of Optics and Fine Mechanics, CAS (China)

Please submit papers on the following and related topics to this conference.

  • Advanced optical manufacturing technologies
  • Aspherical optics design, manufacturing and testing
  • ICF optical technology and engineering
  • Super-precision optical manufacturing
  • Optical thin film coatings
  • Diamond turning technology
  • Optical design and simulation software and tool
  • Optoelectronics components and modules integration and manufacturing
  • Opto-mechanical components and devices

Conference 3: Optical Test and Measurement Technology and Equipments SPIE VOL.7656

Conference Chairs:
ZHANG Yudong, Director of Institute of Optics and Electronics, CAS (China)
Jose M. Sasian, Prof. of University of Arizona (USA)
XIANG Libin, Director of Opto-electronic Research Academy of Chinese Academy of Science (China)
Sandy To, Hong Kong Polytechnic University (China)

Program Committee:
WU Shibing, Institute of Optics and Electronics, CAS (China)
James R. Torley, University of Colorado (USA)
XU Qiao, Chengdu Fine Optical Engineering Research Center (China)
Tadashi Hatano, Tohoku University (Japan)
Hexin Wang, Optical Technology Carl Zeiss AG (Germany)
Mike Conroy, Taylor Hobson Limited (UK)
ZHANG Rongzhu, Sichuan University (China)
Peter C. Chen, The Catholic University (USA)
Mary G. Turner, InfoTek Information Systems (USA)
ZHENG Ligong, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)
Malacara-Doblado Daniel, Centro de Investigaciones en Optica, A. C.Mexico( Mexico)
YANG Yongying, Zhejiang University (China)
Sondes Trabelsi-Bauer, Karlsruhe Research Center (Germany)
NI Qian, Xian Technological University (China)
ARAFA. H. ALY, Chonnam National University (Korea)

Please submit papers on the following and related topics to this conference.

  • Modern interferometric technologies
  • Aspherical optical surface testing
  • Super- precision optical surface testing
  • Measurement of super smooth surface
  • Measurement of optical thin film
  • Test in infrared components and systems
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and softwar

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems SPIE VOL.7657

Conference Chairs:
YE Tianchun, Director of Institute of Microelectronics, Chinese Academy of Science (China£©
Sen Han, Veeco, Inc. (USA)
Masaomi Kameyama, Nikon Corporation (Japan)
HU Song, Institute of Optics and Electronics (IOE), CAS (China)

Program Committee:
LI Yanqiu, Beijing Institute of Technology (China)
Li-Anne Liew, National Institute of Science and Technology (USA)
WANG Xiangchao, Shanghai Institute of Optics and Fine Mechanic, CAS (China)
LI Zhihong, MEMS Center, Beijing University (China)
Yao Li, Centre for Composite Materials, Harbin institute of Technology (China)
Ming Liu, Institute of Microelectronics, CAS (China)
Tadashi Hatano, Tohoku University (Japan)
LI Xiaoping, Shanghai Micro Electronic Equipment Co Ltd China)
Zhichun Ma, Ford Motor Company (USA)
Sung Moon, Korean Institute of Science and Technology (Korea)
ZHAO Qingliang, Harbin institute of Technology (China)

Papers on the following and related topics should be submitted to this conference.

  • Micro-nano optical system design
  • Micro-nano Optical manufacturing and testing
  • Nano metrology technology and tools
  • Nanoscale imaging and sensing technologies
  • Nanofluidics device design, fabrication and testing
  • Fabrication of MEMS/MOEMS devices
  • Testing and Characterization of MEMS/MOEMS
  • MEMS/MOEMS reliability
  • Packaging of MEMS/MOEMS devices
  • Next generation lithography
  • EUVL research and development
  • Advances in thin film coating for MEMS Microfluidics, BioMEMS, and Medical Microsystems

Conference 5 : Opto Electronics Material and Devices for Detector, Imager, Display and Energy Conversion Technology SPIE VOL.7658

Conference Chairs:
JIANG Yadong, Dean of School of Optoelectronic Information, University of Electronic Science and Technology of China
Bernard Kippelen, Vice Director, Center of Organic Photonics and Electronics, Georgia Institute of Technology (USA)
YU Junsheng, State Key Laboratory of Electronic Thin Films and Integrated devices (China)

Program Committee:
GONG Qihuang, Director of State Key Laboratory for Mesoscopic Physics, Department of Physics, Peking University (China)
Kwok, K. W, Director of Display Technology Research Center, The Hong Kong Polytechnic University (China)
MA Dongge, State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, CAS (China)
PEI Qibing, Soft Materials Research Laboratory, Department of Materials Science and Engineering, UCLA (USA)
ZHAO Jianlin, Director of Optical Information Science and Technology, Northwestern Polytechnical University (China)
CHENG Xuemian, Tsinghua University (China)
TAO Yuesheng, Northeast University (China)
LI Weiming, Chengdu Guangming Optoelectronic Co. Lit. (China)

Papers on the following and related topics should be submitted to this conference.

  • Properties of optoelectronic materials
  • Nano materials for optoelectronic device application
  • Properties of Sensing materials in detector technology
  • Detector design, integration, and testing
  • Detector data collection and analysis
  • Vision and image processing
  • Novel display and processing techniques
  • Organic and polymer light emitting device for displays and lighting
  • LED and OLED related technologies
  • Photovoltaic cells for power generation and energy conversion
  • Optical Device for Photovoltaic Technique
  • Thin films solar cell, dye-sensitized solar cells, bulk heterojunction solar cells
  • Thin film transistors technology
  • Organic and polymer memory device

Conference 6 : Smart Structure and Materials in Manufacturing and Testing SPIE VOL.7659

Conference Chairs:
LUO Xiangang, Institute of Optics and Electronics, CAS (China)
George Von Freymann, University of Karlsruhe (Germany)

Program Committee:
Minghui Hong, Singapore National University (Singapore)
L. Jay Guo, University of Michigan (USA)
Teruya Ishihara, Tohoku University (Japan)
Steffen Holtwick, Institute of Nanotechnology (Germany)
ZHANG Fujia, Lanzhou University (China)
Z. James Zhou, School and Computer Engineering, Georgia Institute of Technology (USA)
Hai Ming, University of Science and Technology (China)
ZHAN Qiwen, University of Dayton (USA)
FANG Fengzhou, Tianjing University (China)
ZI Jian, Fudan University (China)
KONG Yongfa, Nankai University (China)

Papers on the following and related topics should be submitted to this conference.

  • Smart structures and materials
  • Structural health monitoring
  • Design, fabrication, and application of metamaterials
  • Plasmonic devices and sensors, optical fiber sensors, sensor networks
  • Plasmonic lithography
  • Directive antenna
  • Design, fabrication, and application of nanostructures
  • Energy harvesting and scavenging
  • Biological-inspired systems
  • Passive and active vibration isolation systems
  • Shape memory alloys
  • SMA- and piezo-based materials and systems
  • Micro and nano integrated systems
  • Aircraft, MAV/UAV and morphing systems
  • Modeling, simulation, optimization, signal processing, control, and design of integrated systems
  • Novel materials and devices
  • Materials for flexible RFID systems
  • RFID and application



@ Important Dates

Conference Dates
26¨C29 April 2010
Abstract Due:
15 December 2009
Manuscript Due:
30 March 2010
Registration Date
25 April 2010
Publishing Date
30 September 2010

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society for Optics and Photonics

@ Cooperating

* German Society of Applied Optics
* Optics and Photonics Society of Singapore
* Optical Society of SichuanProvince
* State Key Laboratory of Microfabrication
* Dalian Institute of Chemical Physics, CAS
* Dalian University of Technology
* Changchun Institute of Fine Optical Machining and Physics, CAS
* ChangchunUniversity of Science and Technology
* NationalUniversity of Defense Technology
* Harbin Institute of Technology
* Beijing Institute of Technology
* University of Electronic Science and Technology of China
* Crystechcoating Inc.

Copyright @ Organizing Committee All Rights Reserved
AOMATT China 2010