The 4th International Symposium on


19-21 November 2008
Chengdu, China
               
               
               
               
               
               
               
               
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@ Detail
Notice (English)(Chinese)
Invitation to Participate
Executive
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Technical Program (PDF)
Printed Call for Papers (PDF)
Sample Manuscript (pdf)
Templates for Download (doc)
Copyright Transfer Form (pdf )
Invitation (PDF Doc)
Hotel Order Form(pdf) (Doc)

Visa Letter Request Form (pdf doc)

Registration Form(Pdf)

@ AOMATT

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Conferences
Special Events
Travel/General
Past Program
Proceedings
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
Contact:
Yang Li
  Email: aomatt08@ioe.ac.cn
  Fax:
86-028-85100583
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2008

Submission

Please read the abstract submission guidelines before you submit your abstract!

    Submit an Abstract for this Conference

Submit your abstracts on the following topics:

Conference 1: Large Mirror and Telescopes

  • Mirrors for large astronomical and space telescopes
  • Light-weighted mirror technology
  • Large deployable mirror and telescopes
  • New and innovative mirror and telescope designs
  • Advanced testing methods for large mirror
  • Support systems and structures
  • New material for large mirrors

Conference 2: Advanced optical manufacturing Technologies

  • Advanced optical manufacturing technologies
  • Aspherical optics design, manufacturing and testing
  • ICF optical technology and engineering
  • Super-precision optical manufacturing
  • Optical thin film coatings
  • Diamond turning technology
  • Optical design and simulation software and tool
  • Optoelectronics components and modules integration and manufacturing
  • Opto-mechanical components and devices

Conference 3: Optical test and measurement Technology and Equipments

  • Modern interferometric technologies
  • Test for aspherical optical surface
  • Test for super- precision optical surface
  • Measurement for super smooth surface
  • Measurement of optical thin film
  • Test with infrared technologies
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems

  • Micro-nano Optical manufacturing and testing
  • Nano metrology technology and tools
  • Nanoscale imaging and sensing technologies
  • Nanofluidics device design, fabrication and testing
  • Fabrication of MEMS/MOEMS devices
  • Testing and Characterization of MEMS/MOEMS
  • MEMS/MOEMS reliability
  • Packaging of MEMS/MOEMS devices
  • Next generation lithography
  • EUVL research and development
  • Advances in thin film coating for MEMS Microfluidics, BioMEMS, and Medical Microsystems

 

(For detailed infomation Please See http://spie.org/app/publications/index.cfm?fuseaction=authinfo&type=manspecs)

For more information, contact:

Phone/Fax: 86-028-85100583 or Email: aomatt08@ioe.ac.cn

 

 


            

@ Important Dates

Conference Dates
19ĘC21 November 2008
Abstract Due:
30 July 2008
Manuscript Due:
25 October 2008
Registration Date
18 November 2008

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society of Optical Engineering

@ Cooperating

*Committee of Optical Manufacturing Technology, COS
*Committee of Optical Testing Technology, COS
*SOS- Sichuan Optical Society
*

Copyright @ Organizing Committee All Rights Reserved
AOMATT China 2008