The 4th International Symposium on

19-21 November 2008
Chengdu, China
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@ Detail
Notice (English)(Chinese)
Invitation to Participate
Technical Program (PDF)
Printed Call for Papers (PDF)
Sample Manuscript (pdf)
Templates for Download (doc)
Copyright Transfer Form (pdf )
Invitation (PDF Doc)
Hotel Order Form(pdf) (Doc)

Visa Letter Request Form (pdf doc)

Registration Form(Pdf)


Special Events
Past Program
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
Yang Li
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2008



Conference 3: Optical Test and Measurement Technology and Equipments

Conference Chairs:
ZHANG Yudong, Director of Institute of Optics and Electronics,CAS (China)
James C. Wyant, Director of Optical Sciences Center, Univ. of Arizona (USA)
Robert Smythe, ZYGO Corporation (USA)
Hexin Wang, Optical Technology Carl Zeiss AG (Germany)

Program Committee:
LI Jingzhen, Shenzhen University (China)
Jose M. Sasian,University Arizona(USA)
Tadashi Hatano,Tohoku University(Japan)
Mike Conroy, Taylor Hobson Limited (England)
SU Chaolian, Xií»an Institute of Technology (China
James R.Torley,University of Colorado(USA)
XU Qiao, Chengdu Fine Optical Engineering Research Center (China)
Peter C. ChenúČThe Catholic University (USA)
Mary G. Turner, InfoTek Information Systems (USA)
HAN Changyuan, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)
Malacara-Doblado Daniel, Centro de Investigaciones en Optica, A. C.Mexico
ARAFA. H. ALY, Chonnam National University (Korea)
Sondes Trabelsi-Bauer, Karlsruhe Research Center (Germany)

Please submit papers on the following and related topics to this conference.

  • Modern interferometric technologies
  • Test for aspherical optical surface
  • Test for super- precision optical surface
  • Measurement for super smooth surface
  • Measurement of optical thin film
  • Test with infrared technologies
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software



@ Important Dates

Conference Dates
19ĘC21 November 2008
Abstract Due:
30 July 2008
Manuscript Due:
25 October 2008
Registration Date
18 November 2008

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society of Optical Engineering

@ Cooperating

*Committee of Optical Manufacturing Technology, COS
*Committee of Optical Testing Technology, COS
*SOS- Sichuan Optical Society

Copyright @ Organizing Committee All Rights Reserved
AOMATT China 2008