The 3rd International Symposium on


8-12 July 2007
Chengdu, China
               
               
               
               
               
               
               
               
English
Register Conferences Special Events Travel / General Past Program Chair Info

@ Call for Paper

Invitation to Participate
Executive
Committee
Letters of Invitation for Visa Process

@ AOMATT

Register
Conferences
Special Events
Travel
Hotel
Proceedings
Author Info
Chair Info
Secretary Info

 

@Past Program

Aomatt00
Aomatt05

@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
Contact:
YANG LI                WEN SHANGming
  Email: aomatt07@ioe.ac.cn
  Fax:
86-028-85100583
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2007

Submission

 

IMPORTANT!

Please send copy of your full- manuscript to aomatt07@ioe.ac.cn when you submit your full- manuscript to SPIE.

Please read the abstract submission guidelines before you submit your abstract!

    Submit an Abstract for this Conference

Submit your abstracts on the following topics:

Conference 1: Large Mirror and Telescopes  SPIE Volume Number 6721

  • Mirrors for large astronomical and space telescopes
  • Light-weighted mirror technology
  • Large deployable mirror and telescopes
  • New and innovative mirror and telescope designs
  • Advanced testing methods for large mirror
  • Support systems and structures
  • New material for large mirrors

Conference 2: Advanced optical manufacturing Technologies  SPIE Volume Number 6722

  • Optical manufacturing technology reviews and roadmaps
  • Aspherical optics design and fabrication
  • ICF optical technology and engineering
  • Super-precision optical manufacturing
  • Optical thin film coatings
  • Diamond turning technology
  • Optical design and simulation software and tool
  • Optoelectronics components and modules integration and manufacturing
  • Opto-mechanical components and devices

Conference 3: Optical test and measurement Technology and Equipments  SPIE Volume Number 6723

  • Modern interferometric technologies
  • Test for aspherical optical surface
  • Test for super- precision optical surface
  • Measurement for super smooth surface
  • Measurement of optical thin film
  • Test with infrared technologies
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems  SPIE Volume Number 6724

  • Micro-nano optical system design
  • Micro-nano Optical manufacturing and testing
  • Nano metrology technology and tools
  • Nanoscale imaging and sensing technologies
  • Nanofluidics device design, fabrication and testing
  • Fabrication of MEMS/MOEMS devices
  • Testing and Characterization of MEMS/MOEMS
  • MEMS/MOEMS reliability
  • Packaging of MEMS/MOEMS devices
  • Next generation lithography
  • EUVL research and development

 


            

@ Important Dates

Conference Dates
8–12 July 2007
Abstract Due:
28 February 2007 Later abstract will be accepted till March20,2007.
Manuscript Due:
Later manuscript will be accepted till June 30,2007.
 

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
The International Society of Optical Engineering
@ Managed By
The Institute of Optics and Electronics

@ Cooperating

                               Committee of Optical  Manufacturing Technology, COS Committee of Optical Testing Technology, COS
SOS-Sichuan  Optical Society   
Others to be added

@ Supported by

                               Chinese Academy of Sciences (CAS) National Natural Science Foundation of China (NSFC)  Others to be added