The 3rd International Symposium on

8-12 July 2007
Chengdu, China
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@Past Program


@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
YANG LI                WEN SHANGming
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2007




Please send copy of your full- manuscript to when you submit your full- manuscript to SPIE.

Please read the abstract submission guidelines before you submit your abstract!

    Submit an Abstract for this Conference

Submit your abstracts on the following topics:

Conference 1: Large Mirror and Telescopes  SPIE Volume Number 6721

  • Mirrors for large astronomical and space telescopes
  • Light-weighted mirror technology
  • Large deployable mirror and telescopes
  • New and innovative mirror and telescope designs
  • Advanced testing methods for large mirror
  • Support systems and structures
  • New material for large mirrors

Conference 2: Advanced optical manufacturing Technologies  SPIE Volume Number 6722

  • Optical manufacturing technology reviews and roadmaps
  • Aspherical optics design and fabrication
  • ICF optical technology and engineering
  • Super-precision optical manufacturing
  • Optical thin film coatings
  • Diamond turning technology
  • Optical design and simulation software and tool
  • Optoelectronics components and modules integration and manufacturing
  • Opto-mechanical components and devices

Conference 3: Optical test and measurement Technology and Equipments  SPIE Volume Number 6723

  • Modern interferometric technologies
  • Test for aspherical optical surface
  • Test for super- precision optical surface
  • Measurement for super smooth surface
  • Measurement of optical thin film
  • Test with infrared technologies
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems  SPIE Volume Number 6724

  • Micro-nano optical system design
  • Micro-nano Optical manufacturing and testing
  • Nano metrology technology and tools
  • Nanoscale imaging and sensing technologies
  • Nanofluidics device design, fabrication and testing
  • Fabrication of MEMS/MOEMS devices
  • Testing and Characterization of MEMS/MOEMS
  • MEMS/MOEMS reliability
  • Packaging of MEMS/MOEMS devices
  • Next generation lithography
  • EUVL research and development



@ Important Dates

Conference Dates
8–12 July 2007
Abstract Due:
28 February 2007 Later abstract will be accepted till March20,2007.
Manuscript Due:
Later manuscript will be accepted till June 30,2007.

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
The International Society of Optical Engineering
@ Managed By
The Institute of Optics and Electronics

@ Cooperating

                               Committee of Optical  Manufacturing Technology, COS Committee of Optical Testing Technology, COS
SOS-Sichuan  Optical Society   
Others to be added

@ Supported by

                               Chinese Academy of Sciences (CAS) National Natural Science Foundation of China (NSFC)  Others to be added