The 3rd International Symposium on


8-12 July 2007
Chengdu, China
               
               
               
               
               
               
               
               
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@ AOMATT

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@ Past Program

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@ Submit an Abstract

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Submission Guidelines
Contact:               YANG LI
WEN SHANGming
  Email: aomatt07@ioe.ac.cn
  Fax:
86-028-85100502
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2007

conferences

Symposium Topics:



Conference 1: large mirror and telescopes  SPIE Volume Number 6721

Chairs:   

JIANG WENhan, Academician, Chinese Academy of  Engineering (China)
Dr. Myung K. Cho, National Optical Astronomy Observatory (USA)

Committee:

Matt Johns, Carnegie Observatories (USA)

Hans J. Kaercher, MAN Technologie AG (Germany)

WU FAN, Institute of Optics and Electronics, Chinese Academy of Sciences (China)

Kathleen A. Richardson, Univ. of Central Florida/CREOL (USA)

YU JINGchi, Suzhou Univ. (China)

Sung-Kie Youn, Korea Advanced Institute of Science and Technology (KAIST) (Korea)

ZHANG XUEjun, Changchun Institute of Fine Mechanics and Physics, CAS (China)

YUAN LVjun, Nanjing Institute of Astronomical Optics and Sciences (China)

Seung-Woo Kim, Korea Advanced Institute of Science and Technology (Korea)

FANG JINGzhong, Institute of Optics and Electronics, Chinese Academy of Sciences (China)

Yuri Storyalove, State Optics Institute (Russia)

 

We invite you to submit papers on the following and related topics to this conference.

   Mirrors for large astronomical and space telescopes

   Light-weighted mirror technology

   Large deployable mirror and telescopes

   New and innovative mirror and telescope designs 

   Advanced testing methods for large mirror

   Support systems and structures  

   New material for large mirrors 

Conference 2: Advanced Optical Manufacturing Technologies SPIE Volume Number 6722

Chairs: 

YANG LI, COMT, COS (China)                 

Yaolong Chen,  (Germany)

Ernst-Bernhard Kley, Friedrich-Schiller-Univ. Jena.  (Germany)

Rongbin Li, Hong Kong Polytechnic University (China)

Committee:   

Paul Kloceck, ELCAN Optical Technologies (USA)

XIN QIming, Beijing Institute of Technology (China)

YU JINGchi, Suzhou Univ.(China)                                                                                                                            Hans Lauth, Jenoptik Laser, Optik System, GmbH (Germany)

HUI CHANGshun, Tianjin Jinhang Institute of Technology Physics (China)

ZHANG JINliang, Xi¨an Institute of Applied Optics (China)

Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)  

Michael Sander,Satisloh GmbH(Germany)

LI WEI, Chengdu Fine Precision Optical Engineering Research Centre (China)

 

Please submit papers on the following and related topics to this conference.

   Optical manufacturing technology and roadmaps

   Aspherical optics design, manufacturing and testing

   ICF optical technology and engineering

   Super-precision optical manufacturing

   Optical thin film coatings

   Diamond turning technology

   Optical design and simulation software and tool

   Optoelectronics components and modules integration and manufacturing

   Opto-mechanical components and devices


Conference 3: Optical Test and Measurement Technology and Equipments  SPIE Volume Number 6723

Chairs: 

PAN JUNhua, Academician, Chinese Academy of Engineering (China)

James C. Wyant, Director of Optical Sciences Center, Univ. of Arizona (USA)

Hexin Wang, Carl Zeiss AG (Germany)

Committee:   

XU DEyan, Shanghai Institute of Optics and Fine Mechanic, CAS (China)

ZHOU RENkui, Xian Institute of Optics and Fine Mechanics, CAS (China)

XU QIAO, Chengdu Fine Optical Engineering Research Center (China)

YANG PENGli, Xi'an Applied Optics Institute (China)

James H. Burge, University of Arizona (USA)

HAN ChANGyuan, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)

Yun-Woo Lee, KRISS (Korea)

SU CHAOlian, Xi'an institute of technology(china) 

 

Please submit papers on the following and related topics to this conference.

   Modern interferometric technologies

   Test for aspherical optical surface

   Test for super- precision optical surface

   Measurement for super smooth surface

   Measurement of optical thin film

   Test with infrared technologies

   Optical contamination

   Optical test and measurement for nanometer technology

   New and innovative metrology and equipment

   Analysis and modeling tools and software

 

Conference 4: Design, Manufacturing and Testing of Micro and Nano Optical Devices and Systems  SPIE Volume Number 6724

Chairs:

Sen Han, Veeco, Inc. (USA)

Zheng Cui, Rutherford Appleton Laboratory (UK)

LI Yanqiu, Institute of Electrical Engineering, CAS (China)

Committee:

Li-Anne Liew, National Institute of Science and Technology (USA)

LUO XIANGgang, Institute of Optics and Electronics, CAS (China)

CHEN BAOqing, Institute of Microelectronics, CAS (China)  

Hans Lauth, Jenoptik Laser, Optik System, GmbH (Germany)

Zhichun Ma, Michigan Aerospace Corp. (USA)

WANG XIANGchao, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

Sung Moon, Korean Institute of Science and Technology (Korea)

ZHAO QINGliang, Harbin institute of technology (China)

Jun Yao, University College London (UK)

FANG FENGzhou, Tianjing University (China)

HU SONG, Institute of Optics and Electronics, CAS (China)

 

Papers on the following and related topics should be submitted to this conference.

   Micro-nano optical system design

   Micro-nano Optical manufacturing and testing

   Nano metrology technology and tools

   Nanoscale imaging and sensing technologies

   Nanofluidics device design, fabrication and testing

   Fabrication of MEMS/MOEMS devices

   Testing and Characterization of MEMS/MOEMS

   MEMS/MOEMS reliability

   Packaging of MEMS/MOEMS devices

   Next generation lithography

   EUVL research and development



            

@ Important Dates

Conference Dates
8C12 July 2007
Abstract Due:
28 February 2007 Later abstract will be accepted till March20,2007.
Manuscript Due:
15 June 2007          Later manuscript will be accepted till June 30,2007.
 

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
The International Society of Optical Engineering
@ Managed By
The Institute of Optics and Electronics

@ Cooperating

                               Committee of Optical  Manufacturing Technology, COS Committee of Optical Testing Technology, COS
SOS- Sichuan Optical Society     Others to be added

@ Supported by

                               Chinese Academy of Sciences (CAS) National Natural Science Foundation of China (NSFC)  Others to be added