The 2nd International Symposium on


2-5 November 2005
Xian, China
               
               
               
               
               
               
               
               
Chinese English
Register Conferences Special Events Travel / General Past Program Chair Info

@ Call for Paper

Invitation to Participate
Executive
Committee
Printed Call for Papers (148 K PDF)
Letters of Invitation for Visa Process

@ AOMATT

Register
Conferences
Special Events
Travel/General
Past Program
Proceedings
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
Contact:
Wen Shangming
(Deputy Secretary General)
  Email: conf@ioe.ac.cn
  Fax:
86-028-85100502
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2005

Submission

Please read the abstract submission guidelines before you submit your abstract!

    Submit an Abstract for this Conference

Submit your abstracts on the following topics:

Conference 1: Large Mirror and Telescopes

  • Mirrors for large astronomical and space telescopes
  • Light-weighted mirror technology
  • Large deployable mirror and telescopes
  • New and innovative mirror and telescope designs
  • Advanced testing methods for large mirror
  • Support systems and structures
  • New material for large mirrors

Conference 2: Advanced optical manufacturing Technologies

  • Optical manufacturing technology reviews and roadmaps
  • Aspherical optics design and fabrication
  • EUVL optical manufacturing
  • Super-precision optical manufacturing
  • MEMS & MOEMS technologies
  • Optical thin film coatings
  • Diamond turning technology
  • Optical design and simulation software and tool
  • Optoelectronics components and modules integration and manufacturing
  • Opto-mechanical components and devices

Conference 3: Optical test and measurement Technology and Equipments

  • Modern interferometric technologies
  • Test for aspherical optical surface
  • Test for super- precision optical surface
  • Measurement for super smooth surface
  • Measurement of optical thin film
  • Test with infrared technologies
  • Optical contamination
  • Optical test and measurement for nanometer technology
  • New and innovative metrology and equipment
  • Analysis and modeling tools and software

(For detailed infomation Please See http://spie.org/app/publications/index.cfm?fuseaction=authinfo&type=manspecs)

For more information, contact:

Wen Shangming, Deputy Secretary General, Fax: 86-028-85100502 or Email: conf@ioe.ac.cn


            

@ Important Dates

Conference Dates
2ĘC5 November 2005
Abstract Due:
30 June 2005
Manuscript Due:
18 October 2005
 

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society of Optical Engineering

@ Cooperating

*Committee of Optical Manufacturing Technology, COS
*Committee of Optical Testing Technology, COS
*National Natural Science Foundation of China
*Xian Institute of Optics and Precision Mechanics, Chinese Academy of Sciences
*Xian Applied Optics Institute
*Xian Institute of Technology
*Xian Jiaotong University
*Northwestern Polytechnical University