The 2nd International Symposium on

2-5 November 2005
Xian, China
Chinese English
Register Conferences Special Events Travel / General Past Program Chair Info

@ Conferences

Symposium Topics
Plenary Presentation
Printed Call for Papers (148 K PDF)


Special Events
Past Program
Author Info
Chair Info

@ Submit an Abstract

Submit an Abstruct
Submission Guidelines
Wen Shangming
(Deputy Secretary General)
  P.O. Box 350, Shuangliu, Chengdu, China 610209

Advanced Optical Manufacturing
and Testing
Technologies 2005


Symposium Topics:

Conference 1: Large Mirror and Telescopes


JIANG Wenhan, Academician, Chinese Academy of Engineering (China)
Myung K. Cho, National Optical Astronomy Observatory (USA)

Matt Johns, Carnegie Observatories (USA)
Hans J. Kaercher, MAN Technologie AG (Germany)
WU Fan, Institute of Optics and Electronics, ChineseAcademy of Sciences (China)
Kathleen A. Richardson, Univ. of Central Florida/CREOL (USA)
YU Jingchi, Suzhou Univ. (China)
Sung-Kie Youn, Korea Advanced Institute of Science and Technology (KAIST) (Korea)
ZHANG Xuejun, Changchun Institute of Fine Mechanics and Physics, CAS (China)
YUAN Lvjun, Nanjing Institute of Astronomical Optics & Sciences (China)
Seung-Woo Kim, Korea Advanced Institute of Science and Technology (Korea)
FANG Jingzhong, Institute of Optics and Electronics, ChineseAcademy of Sciences (China)
Yuri Storyalove, State Optics Institute (Russia)

We invite you to submit papers on the following and related topics to this conference.
1. Mirrors for large astronomical and space telescopes;
2. Light-weighted mirror technology;
3. Large deployable mirror and telescopes;
4. New and innovative mirror and telescope designs;
5. Advanced testing methods for large mirror;
6. Support systems and structures;
7. New material for large mirrors;

Conference 2: Advanced Optical Manufacturing Technologies


YANG Li, Committee of Optical Manufacturing Technology, COS (China)
Yaolong Chen, Herbert Kubatz GmbH & Co. (Germany)
E.Kley, Friedrich-Schiller-Univ. Jena. (Germany)

Rongbin Li, Hong KongPolytechnicUniversity (Hong Kong )
Paul Kloceck, ELCAN-Texas Optical Technologies (USA)
Xin Qiming, Beijing Institute of Technology (China)
YU Jingchi, SuzhouUniv. (China)

Hans Lauth, Jenoptik Laser, Optik System,GmbH (Germany)
Gerald Klein, LOH Optikmaschinen AG (Germany)
HUI Changshun, Tianjin Jinhang Institute of Technology Physics (China)
ZHANG Jinliang, XiĄŻan Institute of Applied Optics (China)
Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)
LI Wei, Chengdu Fine Precision Optical Engineering Research Centre (China)

Please submit papers on the following and related topics to this conference.
1. Optical manufacturing technology reviews and roadmaps;
2. Aspherical optics design and fabrication;
3. EUVL optical manufacturing;
4. Super-precision optical manufacturing;
5. MEMS & MOEMS technologies;
6. Optical thin film coatings;
7. Diamond turning technology;
8. Optical design and simulation software and tool;
9. Optoelectronics components and modules integration and manufacturing;
10. Opto-mechanical components and devices;

Conference 3: Optical Test and Measurement Technology and Equipments

HOU Xun, Academician, ChineseAcademy of sciences (China)
James C. Wyant, Optical SciencesCenter, Univ. of Arizona (USA)
Hexin Wang, Carl Zeiss  AG (Germany)

XU Deyan, Shanghai Institute of Optics and Fine Mechanic, ChineseAcademy of Sciences (China)
Shen Han, VECCO (USA)
ZHOU Renkui, Xian Institute of optics and fine mechanics, CAS (China)
XU Qiao, Chengdu Fine Optical EngineeringResearchCenter (China)
YANG Pengli, Xian Applied Optics Institute (China)
James H. Burge, University of Arizona (USA)
HAN Changyuan, Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China)
SU Chaolian, XiĄŻan Institute of Technology (China)

Please submit papers on the following and related topics to this conference.
1. Modern interferometric technologies;
2. Test for aspherical optical surface;
3. Test for super- precision optical surface;
4. Measurement for super smooth surface;
5. Measurement of optical thin film;
6. Test with infrared technologies;
7. Optical contamination;
8. Optical test and measurement for nanometer technology;
9. New and innovative metrology and equipment;
10. Analysis and modeling tools and software.


@ Important Dates

Conference Dates
2¨C5 November 2005
Abstract Due:
30 June 2005
Manuscript Due:
18 October 2005

@ Sponsored By

The Institute of Optics and Electronics
The Chinese Optical Society
@ Technical Cosponsor
The International Society of Optical Engineering

@ Cooperating

*Committee of Optical Manufacturing Technology, COS
*Committee of Optical Testing Technology, COS
*National Natural Science Foundation of China
*Xian Institute of Optics and Precision Mechanics, Chinese Academy of Sciences
*Xian Applied Optics Institute
*Xian Institute of Technology
*Xian Jiaotong University
*Northwestern Polytechnical University